The project is aimed at investigating the behavior of insulating polymers, subjected to extreme stress conditions, close to the interface with electrodes as well as of nanoinclusions added for improving their performance, by means of super-resolved microscopy techniques named electrostatic force microscopy (EFM). The microscopes available for this project are capable to investigate functional properties of materials, in addition to their morphology, with a spatial resolution of a few nanometers, that is at the current state-of-the-art concerning the measurement of local electric properties.