Istituto per i Processi Chimico Fisici

HELIOS is a CCD-based broadband pump-probe femtosecond Transient Absorption Spectrometer Helios, used for monitoring extremely short-lived optically absorbing states. The experimental time window ranges from femtoseconds to nanoseconds. Helios is designed to work with amplified femtosecond lasers for application in

Ultracentrifuge for material separation based on size and density. Nome e marca dello strumento Ultracentrifuge Beckman Optima L-60 Ubicazione Lab 134 Anno fabbricazione/installazione 1992 Descrizione caratteristiche operative •60,000 RPM max speed •Vacuum encased brushless induction drive •CFC-free refrigeration system •Run

The spinner rotates an object (substrate), and use the centrifugal force to spread a liquid across the surface. Uses include cleaning a substrate surface, conditioning the surface for following processes, coating the surface with a thin uniform film, developing micro

The Nikon C1 confocal system delivers 3 dimensional confocal fluorescent images of samples with high resolution and contrast. Confocal microscopy allows analysis of fluorescent labeled thick specimens without physical sectioning. Optical sections are generated by eliminating out-of-focus fluorescence and displayed

Spectrofluorometer with Photon Counter detector for emission measurements in steady state and time resolved mode by Time Correlated Single Photon Counting (TCSPC), on solution and thin films. The double-grating monochromators in excitation and emission positions allow investigation on highly scattering

Peltier cooled sputter head that allows fine coating (order of 0.5nm Cr Grain Size) and thin Film deposition (typically 5nm) of metals for SEM sample preparation. The system is equipped with: • Special Rotating Stage with Full Tilt Facility fitted

Spettrofotometro mono-raggio operante a singola lunghezza d’onda per misure risolte nel tempo con possibilità di fotoeccitazione del campione con lampada flash. Nome e marca dello strumento Spettrofotometro cinetico home made Ubicazione Lab 134, sede di Bari Anno fabbricazione/installazione 2000 Descrizione

SIGMA is a high-resolution scanning electron microscope (SEM) with field emission gun. The Gemini objective lens design combines electrostatic and magnetic fields to maximize optical performance while reducing field influences at the sample to a minimum. This enables excellent imaging,

JEOL JEM-1010 is a highly integrated compact transmission electron microscope (TEM) with advanced features and functions. The operating voltage ranges from 40kV to 100kV which is ideal for life science as well as material science applications. JEM-1010 is a high-contrast

Atomic Force Microscope for morphological studies of surfaces and nanostructured materials at the nanoscale. It provides three-dimensional topography and surface measurements at atomic resolution, with easy sample preparation and manipulation. Nome e marca dello strumento Atomic Force Microscope AFM XE