Category Archives: Strum-Ba

Helios Femtosecond Transient Absorption Spectrometer and Halcyione Spectrofluorimeter Ultrafast Systems

HELIOS is a CCD-based broadband pump-probe femtosecond Transient Absorption Spectrometer Helios, used for monitoring extremely short-lived optically
absorbing states. The experimental time window ranges from femtoseconds to nanoseconds. Helios is designed to work with amplified femtosecond lasers for application in Photophysics, Photochemistry,
Materials science, Nanoscience, Transient spectrometry, and many more areas.
Halcyone is a Femtosecond Fluorescence Upconversion Kinetic Spectrometer with luminescence detection range 400 nm – 1600 nm (depends on the excitation and gate wavelengths). HALCYONE is be equipped with a TCSPC add-on for extending its time window.

Nome e marca dello strumento Helios Femtosecond Transient Absorption Spectrometer and Halcyione Spectrofluorimeter Ultrafast Systems
Ubicazione Lab. of Prof. R. Tommasi, Dept of Basic Medical Sciences, Neurosciences and Sense Organs, University of Bari, P.zza G. Cesare 11 Bari
Anno fabbricazione/installazione 2012
Descrizione caratteristiche operative The laser system of the lab is composed of:
a diode-pumped Ti:Sapphire femtosecond oscillator (Mai Tai, Spectra Physics),
a regenerative Ti:Sapphire amplifier (Spitfire Pro, Spectra Physics), pumped by a Q-switched Nd3+:YLF laser (Empower, Spectra Physics), an OPA (optical parametric amplifier, TOPAS-C, Spectra Physics) tunable in a broad spectral range (290−2600 nm).Helios Specifications:
Low profile direct-drive ultra-high speed optical delay line integrated in the spectrometer housing.
Time window: 3 ns
Resolution: 14 fs
Minimum step size: 2.8 fs
Max. speed: >10 ns/s
Acceleration: > 260 ns/s^2
Temporal Resolution. The instrument response function is a cross-correlation of the pump and probe pulses. The typical HELIOS IRF is 1.4 times longer than the laser’s fundamental pulse duration.
Probe spectral range 450-800 nm and 800-1600 nm
Spectral Resolution VIS 2 nm and NIR 5 nmHalcyone Specifications:
Spectral range:
– Upconversion mode: 320-1600 nm
– TCSPC mode: 400-900 nm
Time:
– Upconversion mode: 3.3 ns
– TCSPC mode: from 15nsec to 1msec
Time resolution
– Upconversion mode: correlate to the pulse lenght
– TCSPC mode: 200 ps
Campi di applicazione The Helios Transient Absorption Spectrometer has several application such as:
Photo-processes
Non-radiative transitions and excited state dynamics
Blinking in fluorescence
Material properties of metal nanoparticles
Photochemistry of Vis and NIR emitting quantum dots
Non-linear absorption and optical limiting in the near infrared
Surface plasmon resonance of metal nanoparticles
Quantum confinement in optically excited materialsHalcyone Spectrofluorimeter:
Electronic deactivation
Solvation dynamics
Energy transfer
Intersystem crossing
Vibrational relaxation
Internal conversion
Electron transfer, etc
Responsabile
Nome e Cognome Raffaele Tommasi
Email raffaele.tommasi@uniba.it
Telefono +39 080 5448561

Ultracentrifuge Beckman Optima L-60

Ultracentrifuge for material separation based on size and density.

Nome e marca dello strumento Ultracentrifuge Beckman Optima L-60
Ubicazione Lab 134
Anno fabbricazione/installazione 1992
Descrizione caratteristiche operative •60,000 RPM max speed
•Vacuum encased brushless induction drive
•CFC-free refrigeration system
•Run time of up to 99 hours & 59 minutes
•Temperature range of 0°C to 40°C
The Optima L-60 is compatible with fixed-angle and swing-bucket rotors in multiple capacity configurations.
Campi di applicazione Differential centrifugation for cell fractionation of procariotic and eucariotic organisms. Protein purification. Nanoparticles separation.
Responsabile
Nome e Cognome Massimo Trotta
Email m.trotta@ba.ipcf.cnr.it
Telefono +39 080 5442033

Spin coater Headway Research EC 101 DT and Hot Plate EMS model 1000-1

The spinner rotates an object (substrate), and use the centrifugal force to spread a liquid across the surface. Uses include cleaning a substrate surface, conditioning the surface for following processes, coating the surface with a thin uniform film, developing micro images in exposed photosensitive coatings.
The EMS Precision Electronic Hot Plate Model 1000-1 provides uniform baking of substrates with even temperatures across a surface.

Nome e marca dello strumento Spin coater Headway Research EC 101 DT and Hot Plate EMS model 1000-1
Ubicazione Lab. 105, sede di Bari
Anno fabbricazione/installazione 2004
Descrizione caratteristiche operative Spinner:
Speed Range: 50 to 10,000 rpm
Adjustable Acceleration: 200 msec to 1.2 sec
Spin Time:
0.01 to 9.99 seconds, minutes or hours
0.10 to 99.9 seconds, minutes or hours
1.00 to 999 seconds, minutes or hoursHot Plate:
Temperatures from 50°C to 150°C
Accurate to ±1% across working surface
Vacuum ports ensure intimate contact between substrate and hoteplate
Substrate size from 10 mm to 150 mm
PID Temperature Controller with digital readout
User settable power limit
Campi di applicazione Preparation of thin films and nanocomposite materials, deposition of nanomaterials on TEM grids.
Responsabile
Nome e Cognome Marinella Striccoli
Email m.striccoli@ba.ipcf.cnr.it
Telefono +39 080 5442027

Confocal Microscope C1 Plus Nikon

The Nikon C1 confocal system delivers 3 dimensional confocal fluorescent images of samples with high resolution and contrast.
Confocal microscopy allows analysis of fluorescent labeled thick specimens without physical sectioning. Optical sections are generated by eliminating out-of-focus fluorescence and displayed as digitalized images. It allows 3-dimensional reconstruction (XYZ) and time-analysis (XYT), thus providing unique chance to link morphology with cell function.

Nome e marca dello strumento Confocal Microscope C1 Plus Nikon
Ubicazione Lab. 135, sede di Bari
Anno fabbricazione/installazione 2010
Descrizione caratteristiche operative The Nikon C1 confocal system is equipped with a Nikon Eclipse E600 direct microscope and 2 laser (a diode module at 405 nm and a multiline Ar laser with emission at 457/488/514nm). Its scanning head has 3 photomultiplier tubes (PMTs) which can detect simultaneous 3-channel fluorescence in double- and triple-labelling experiments. The microscope is equipped with several objectives in air (from 5X to 40X and with a 60X in oil. A digital camera provide bright-field and fluorescent imaging capabilities (image resolution: 1600×1200 pixels).
Campi di applicazione The broad range of applications available to laser confocal microscopy includes a wide variety of studies in material science as well as morphological studies of a wide spectrum of cells and tissues. The CNR IPCF Bari synthesizes by colloidal approach new fluorescent inorganic nanostructures that are used as probes. Other applications include resonance energy transfer, stem cell research, photobleaching studies, total internal reflection, bioluminescent proteins etc.
Responsabile
Nome e Cognome Marinella Striccoli
Email m.striccoli@ba.ipcf.cnr.it
Telefono +39 080 5442027

FluoroLog 3-221 Horiba Jobin Yvon

Spectrofluorometer with Photon Counter detector for emission measurements in steady state and time resolved mode by Time Correlated Single Photon Counting (TCSPC), on solution and thin films. The double-grating monochromators in excitation
and emission positions allow investigation on highly scattering biological samples or
solids like powders, semiconductors, or phosphors. The system has a single monochromator and detector extension for steady state measurements in the NIR.

Nome e marca dello strumento FluoroLog 3-221 Horiba Jobin Yvon
Ubicazione Lab. 135, first floor, Chemistry Department, University of Bari
Anno fabbricazione/installazione 2006
Descrizione caratteristiche operative Excitation source: 450 W Xe lamp
Monochromators (excitation emission): f/3.6 Czeny-Turner, double grating, all reflective optics
Diffraction gratings: classically ruled, 1200 tr/mm; blaze 330nm and 500nm
Emission signal detector: at room tempe-rature-R928P side-on photomultiplier tube (180-850nm), TBX photon counter (300-850nm) and Peltier cooled InGaAs (900-1500nm)
Software package: FluorEssence 2.0 (powered by Origin 7.5)
Performances:
TCSPC LIFETIME Lifetime range: 200ps-100μs
excitation sources: pulsed laser diode: 485 nm; 375 nm and 635 nm NanoLeds.
Software for single photon counting data acquisition and for decay analysis.
Integration sphere for PL QY in visible range.
Campi di applicazione Fluorescence measurements on emitting materials, both solids and thin films. It allows measurements of PL, PLE, Fluorescence Anisotropy and Absolute Quantum Yield and Time Resolved in the visible range and PL emission in the NIR.
Responsabile
Nome e Cognome Marinella Striccoli
Email m.striccoli@ba.ipcf.cnr.it
Telefono +39 080 5442027

Sputter coater K575X Quorum

Peltier cooled sputter head that allows fine coating (order of 0.5nm Cr Grain Size) and thin Film deposition (typically 5nm) of metals for SEM sample preparation. The system is equipped with:
• Special Rotating Stage with Full Tilt Facility fitted as standard
• 165mm Diameter Chamber
• Dual Sputter Head
• Film Thickness Monitor
• Target of Cr ad Au
• No cooling water required
• Ultra high resolution reproducible coatings
• Repeatable film thickness depositions
• Easy loading and unloading of samples
• Allows sequential coatings to be made without breaking vacuum
• Can pre-set deposition thickness
It can quickly be converted to deposit carbon by the addition of a carbon evaporation attachment, consisting of a switchable voltage power supply and a carbon fibre head (CA7625 carbon accessory)

Nome e marca dello strumento Sputter coater K575X Quorum
Ubicazione Lab. A10, Tecnopolis, Valenzano (BA)
Anno fabbricazione/installazione 2010
Descrizione caratteristiche operative Instrument Case: 450mm Wide x 350mm Deep x 175mm High
Work Chamber: Borosilicate Glass 165mm Dia x 125mm
High Safety Shield: Polycarbonate
Target: 54mm Dia x 0.2mm Thick (Chromium fitted as Standard)
Specimen Stage: 60mm Dia. Rotating Stage with Tilt facility.
Vacuum Gauge Range: 1×10-3 – 1×10-4 mbar
Deposition Current: 0-150mA
Deposition Rate: 0-20nm/Minute
Sputter Timer: 0-4 minutes
Turbomolecular Pump: 60 litres/Second (Ultimate vacuum 1×10-8 mbar)
Campi di applicazione Deposition of thin films of metals (Au and Cr) and metal oxides on non conductive specimens for SEM by magnetron sputtering.
In addition the system is equipped with a head for carbon evaporation.
Responsabile
Nome e Cognome Marinella Striccoli
Email m.striccoli@ba.ipcf.cnr.it
Telefono +39 080 5442027

Spettrofotometro cinetico home made

Spettrofotometro mono-raggio operante a singola lunghezza d’onda per misure risolte nel tempo con possibilità di fotoeccitazione del campione con lampada flash.

Nome e marca dello strumento Spettrofotometro cinetico home made
Ubicazione Lab 134, sede di Bari
Anno fabbricazione/installazione 2000
Descrizione caratteristiche operative Luce di misura: lampada QTH da 150W con alimentatore a potenza e corrente variabili; monocromatore a reticolo con 1200 linee/mm; rivelatore: fotomoltiplicatore
acquisizione del segnale: oscilloscopio Tektronics TDS3052 interfacciato a PC con software Labview sviluppato in loco.
Eccitazione del campione: lampada flash allo xeno da 15 W. Termostatato. Risoluzione temporale: 0.1 ms.
Campi di applicazione Attualmente utilizzato per lo studio del centro di reazione fotosintetico di Rb. sphaeroides
Responsabile
Nome e Cognome Francesco Milano
Email francesco.milano@cnr.it
Telefono +39 080 5442033

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Field Emission Scanning Electron Microscope SIGMA ZEISS

SIGMA is a high-resolution scanning electron microscope (SEM) with field emission gun. The Gemini objective lens design combines electrostatic and magnetic fields to maximize optical performance while reducing field influences at the sample to a minimum. This enables excellent imaging, even on challenging samples such as magnetic materials.
The Gemini in-lens detection concept ensures efficient signal detection by detecting secondary (SE) and/or backscattered (BSE) electrons minimizing time-to-image. The maximum resolution can reach ~1nm. Tne SEM is equipped with energy-dispersive X-ray spectroscopy (EDS) system that enables sample element analysis.

Nome e marca dello strumento Field Emission Scanning Electron Microscope SIGMA ZEISS
Ubicazione Lab. A10, Tecnopolis, Valenzano (BA)
Anno fabbricazione/installazione 2011
Descrizione caratteristiche operative Electron Source Schottky Thermal Field Emitter
Resolution @ 15 kV 1.2 nm
Resolution @ 1 kV 2.2 nm
Backscatter Detector (BSD) HD BSD
Maximum Scan Speed 100 ns/pixel
Accelerating Voltage 0.02 – 30 kV
Magnification 10× – 1,000,000×
Probe Current 4 pA – 20 nA
Image Framestore 3 k × 2 k pixels
The SEM is equipped with a sputter coater for the preparation and coating of non conductive samples with this layers of Au or Cr
Campi di applicazione Morphological and compositional characterization of different kind of samples and surfaces. In particular for the investigation of nanoparticles and nanocrystals deposited or assembled on substrate, of nanocomposite materials and of functionalized materials.
Responsabile
Nome e Cognome Marinella Striccoli
Email m.striccoli@ba.ipcf.cnr.it
Telefono +39 080 5442027

Transmission Electron Microscope JEOL JEM-1010

JEOL JEM-1010 is a highly integrated compact transmission electron microscope (TEM) with advanced features and functions. The operating voltage ranges from 40kV to 100kV which is ideal for life science as well as material science applications. JEM-1010 is a high-contrast TEM because of low operating voltage and the design of objective pole piece. In addition, it is equipped with a CCD camera for digital image acquisition and a EDX system (Energy Dispersive X-Ray Spectroscopy) to identify the elemental composition of materials.

Nome e marca dello strumento Transmission Electron Microscope JEOL JEM-1010
Ubicazione Lab. A10, Tecnopolis, Valenzano (BA)
Anno fabbricazione/installazione 2011
Descrizione caratteristiche operative Instrument Specifications:
Electron Source: Precentered hairpin type tungsten filament
Accelerating Voltage from 40kv to 100kv
Operation Modes: Bright Field, Dark Field
Diffraction
Magnification: Low Mag Mode 50x to 1,000x
Standard Mag Mode 600x to 500,000x
TEM Resolution 0.45nm point to point
Sample Holders Jeol single tilt with two specimens capacity
Tilt Angles X-tilt +/-60°
Image Recording 2048×2048 pixels
Campi di applicazione Structural and chemical characterization of materials the nanoscale. In particular the TEM is mainly used for the morphological characterization (size, shape and size distribution) of nanomaterials prepared by chemical synthetic approaches.
Responsabile
Nome e Cognome Marinella Striccoli
Email m.striccoli@ba.ipcf.cnr.it
Telefono +39 080 5442027

Atomic Force Microscope AFM XE 100 PSIA

Atomic Force Microscope for morphological studies of surfaces and nanostructured materials at the nanoscale. It provides three-dimensional topography and surface measurements at atomic resolution, with easy sample preparation and manipulation.

Nome e marca dello strumento Atomic Force Microscope AFM XE 100 PSIA
Ubicazione Lab. 135, first floor, Chemistry Department, University of Bari
Anno fabbricazione/installazione 2005
Descrizione caratteristiche operative Decoupled XY and Z scanner
Single module flexure XY scanner with closed-loop control
Scan range of XY scanners: 5 µm, 50 µm, or 100 µm
Scan range of Z scanners: 12 µm or 25 µm
Stage
Working range of XY stage: 25 mm × 25 mm, manual precision movement
Working range of Z stage: 27.5 mm, motorized movement
Measureable sample size: 80 mm × 80 mm, 20 mm thick, and up to 500 g
Head
Detection of cantilever deflection
Laser Diode: 650 nm
Super Luminescent Diode: 835 nm with low coherency
Optical access availability (optional)
On-axis vision of sample surface and cantilever
Focus range: 20 mm, motorized
Magnification: 780× (optional 160×, 390×, and 1500×)
Field of view: 480 µm × 360 µm
Optical resolution: 1 µm
Electronics
High performance DSP: 600 MHz with 4800 MIPS
Maximum image size: 16 data channels of 4096 × 4096 pixels
Signal inputs: 20 channels of 16 bit ADC at 500 kHz sampling
Signal outputs: 21 channels of 16 bit DAC at 500 kHz settling
Electric signal noise: < 10 pA (system default), < 0.1 pA (optional)
Synchronous signal: End-of-image, end-of-line, and end-of-pixel TTL signals
Active Q control (optional)
Cantilever spring constant calibration (optional)
Software XEP
Dedicated system control and data acquisition software
Adjusting feedback gain, set point, drive frequency/amplitude/phase in real time
AFM data analysis software
True Non-Contact Mode
Contact mode
Lateral Force Microscopy
Force – distance spectroscopy
Phase imaging of True Non-Contact, FMM, MFM, EFM, and SCM
Conductive AFM
Scanning Tunneling Microscopy
Electric Force Microscopy
Scanning Capacitance Microscopy
Campi di applicazione Investigation of the morphological properties of functionalized surfaces, nanocomposite materials and 2D/3D assembly of nanoparticles and nanocristals on substrates.
Responsabile
Nome e Cognome Marinella Striccoli
Email m.striccoli@ba.ipcf.cnr.it
Telefono +39 080 5442027