Transmission Electron Microscope JEOL JEM-1010
JEOL JEM-1010 is a highly integrated compact transmission electron microscope (TEM) with advanced features and functions. The operating voltage ranges from 40kV to 100kV which is ideal for life science as well as material science applications. JEM-1010 is a high-contrast TEM because of low operating voltage and the design of objective pole piece. In addition, it is equipped with a CCD camera for digital image acquisition and a EDX system (Energy Dispersive X-Ray Spectroscopy) to identify the elemental composition of materials.
| Nome e marca dello strumento | Transmission Electron Microscope JEOL JEM-1010 |
| Ubicazione | Lab. A10, Tecnopolis, Valenzano (BA) |
| Anno fabbricazione/installazione | 2011 |
| Descrizione caratteristiche operative | Instrument Specifications: Electron Source: Precentered hairpin type tungsten filament Accelerating Voltage from 40kv to 100kv Operation Modes: Bright Field, Dark Field Diffraction Magnification: Low Mag Mode 50x to 1,000x Standard Mag Mode 600x to 500,000x TEM Resolution 0.45nm point to point Sample Holders Jeol single tilt with two specimens capacity Tilt Angles X-tilt +/-60° Image Recording 2048×2048 pixels |
| Campi di applicazione | Structural and chemical characterization of materials the nanoscale. In particular the TEM is mainly used for the morphological characterization (size, shape and size distribution) of nanomaterials prepared by chemical synthetic approaches. |
| Responsabile | |
| Nome e Cognome | Marinella Striccoli |
| m.striccoli@ba.ipcf.cnr.it | |
| Telefono | +39 080 5442027 |