Transmission Electron Microscope JEOL JEM-1010

JEOL JEM-1010 is a highly integrated compact transmission electron microscope (TEM) with advanced features and functions. The operating voltage ranges from 40kV to 100kV which is ideal for life science as well as material science applications. JEM-1010 is a high-contrast TEM because of low operating voltage and the design of objective pole piece. In addition, it is equipped with a CCD camera for digital image acquisition and a EDX system (Energy Dispersive X-Ray Spectroscopy) to identify the elemental composition of materials.

Nome e marca dello strumento Transmission Electron Microscope JEOL JEM-1010
Ubicazione Lab. A10, Tecnopolis, Valenzano (BA)
Anno fabbricazione/installazione 2011
Descrizione caratteristiche operative Instrument Specifications:
Electron Source: Precentered hairpin type tungsten filament
Accelerating Voltage from 40kv to 100kv
Operation Modes: Bright Field, Dark Field
Magnification: Low Mag Mode 50x to 1,000x
Standard Mag Mode 600x to 500,000x
TEM Resolution 0.45nm point to point
Sample Holders Jeol single tilt with two specimens capacity
Tilt Angles X-tilt +/-60°
Image Recording 2048×2048 pixels
Campi di applicazione Structural and chemical characterization of materials the nanoscale. In particular the TEM is mainly used for the morphological characterization (size, shape and size distribution) of nanomaterials prepared by chemical synthetic approaches.
Nome e Cognome Marinella Striccoli
Telefono +39 080 5442027