Atomic Force Microscope AFM XE 100 PSIA
Atomic Force Microscope for morphological studies of surfaces and nanostructured materials at the nanoscale. It provides three-dimensional topography and surface measurements at atomic resolution, with easy sample preparation and manipulation.
| Nome e marca dello strumento | Atomic Force Microscope AFM XE 100 PSIA |
| Ubicazione | Lab. 135, first floor, Chemistry Department, University of Bari |
| Anno fabbricazione/installazione | 2005 |
| Descrizione caratteristiche operative | Decoupled XY and Z scanner Single module flexure XY scanner with closed-loop control Scan range of XY scanners: 5 µm, 50 µm, or 100 µm Scan range of Z scanners: 12 µm or 25 µm Stage Working range of XY stage: 25 mm × 25 mm, manual precision movement Working range of Z stage: 27.5 mm, motorized movement Measureable sample size: 80 mm × 80 mm, 20 mm thick, and up to 500 g Head Detection of cantilever deflection Laser Diode: 650 nm Super Luminescent Diode: 835 nm with low coherency Optical access availability (optional) On-axis vision of sample surface and cantilever Focus range: 20 mm, motorized Magnification: 780× (optional 160×, 390×, and 1500×) Field of view: 480 µm × 360 µm Optical resolution: 1 µm Electronics High performance DSP: 600 MHz with 4800 MIPS Maximum image size: 16 data channels of 4096 × 4096 pixels Signal inputs: 20 channels of 16 bit ADC at 500 kHz sampling Signal outputs: 21 channels of 16 bit DAC at 500 kHz settling Electric signal noise: < 10 pA (system default), < 0.1 pA (optional) Synchronous signal: End-of-image, end-of-line, and end-of-pixel TTL signals Active Q control (optional) Cantilever spring constant calibration (optional) Software XEP Dedicated system control and data acquisition software Adjusting feedback gain, set point, drive frequency/amplitude/phase in real time AFM data analysis software True Non-Contact Mode Contact mode Lateral Force Microscopy Force – distance spectroscopy Phase imaging of True Non-Contact, FMM, MFM, EFM, and SCM Conductive AFM Scanning Tunneling Microscopy Electric Force Microscopy Scanning Capacitance Microscopy |
| Campi di applicazione | Investigation of the morphological properties of functionalized surfaces, nanocomposite materials and 2D/3D assembly of nanoparticles and nanocristals on substrates. |
| Responsabile | |
| Nome e Cognome | Marinella Striccoli |
| m.striccoli@ba.ipcf.cnr.it | |
| Telefono | +39 080 5442027 |